New Digital Testing of Analogue Circuits
نویسندگان
چکیده
منابع مشابه
Testing of Analogue Circuits via (Standard) Digital Gates
The possibility of using window comparators for onchip (and potentially on-line) response evaluation of analogue circuits is investigated. No additional analogue test inputs are required and the additional circuitry can be realised either by means of standard digital gates taken from an available library or by full custom designed gates to obtain an observation window tailored to the applicatio...
متن کاملStatic Simulation of CNTFET-based Digital Circuits
In this paper we implement a simple DC model for CNTFETs already proposed by us in order to carry out static analysis of basic digital circuits. To verify the validity of the obtained results, they are compared with those of Wong model, resulting in good agreement, but obtaining a lighter ensuring compile and shorter execution time, which are the main character...
متن کاملTesting Digital Circuits with Constraints
* This work was done at Stanford-CRC and was supported by King Fahd University of Petroleum and Minerals. It was also supported by DARPA under contract No. DABT63-97-C-0024 (ROAR project). The authors would like to thank Chien-Mo Li and Chao-Wen Tseng for their help. Abstract Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two...
متن کاملTesting Technique for Digital Circuits
In this paper, we present a method of testing digital circuits during normal operation. The resources used to perform on-line testing are those which are inserted to alleviate the off-line testing problem. The off-line testing resources are modified such that during system operation they can also observe the normal inputs and outputs of a combinational circuit under test. The normal inputs to t...
متن کاملDynamic Simulation of CNTFET-Based Digital Circuits
In this paper we propose a simulation study to carry out dynamic analysis of CNTFET-based digital circuit, introducing in the semi-empirical compact model for CNTFETs, already proposed by us, both the quantum capacitance effects and the sub-threshold currents. To verify the validity of the obtained results, a comparison with Wong model was carried out. Our mode...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: International Conference on Aerospace Sciences and Aviation Technology
سال: 2015
ISSN: 2636-364X
DOI: 10.21608/asat.2015.22880